Specifications of some objects for the SSD data base

Specifications of some objects for the SSD data base. The fields are in red. Some of them do probably not belong to the object itself but to the node table which connects the object to its parent and children (they are in green).

ADC board :
Only one state

board number : ADC_XX

field with yes or no : assembled, tested, debugged, accepted, destroyed

field with yes or no : equipped (assembled with components)

field with text : comment

side : 1 (for the P side) or 2 (for the N side) on the ladder

parent : ladder id

switch : hardware address of the board encoded with 4 bits

C2D2 board (connection board) :
Only one state

board number : C2D2_XX

field with yes or no : assembled, tested, debugged, accepted, destroyed

field with yes or no : equipped (assembled with components)

field with text : comment

side : 1 (for the P side) or 2 (for the N side) on the ladder

parent : ladder id

switch : hardware address of the board encoded with 4 bits

measurement of latch up detection: 19 values in Volts with two digit precision ( x,xx V)

V1_1 , V1_2, V1_3, V1_4

V2_1, V3_1, V4_1, V5_1, V6_1, V7_1, V8_1, V9_1,

V10_1, V11_1, V12_1, V13_1, V14_1, V15_1, V16_1

Readout board :
Only one state

board number : RDO_XX

field with yes or no : assembled, tested, debugged, accepted, destroyed

field with yes or no : equipped (assembled with components)

field with text: comment

parent : clamshell id (1 or 2 for the two half-clamshell)

clamshell side : 1 (for the P side) or 2 (for the N side) on the ladder

TPC location : East or West end

Switch : hardware address for TPC location (5 bits)

Connection bus :
Only one state

bus number : BUS_XXXX

type of bus : l1,l2,l3,l4,l5,l6,l7,l8,L1,L2,L3,L4,L5,L6,L7,L8 or from 1 to 16

Batch : production batch from 0 up to 20

Quality : 0 (unknown), 1 (good), 2 (repaired) or 3 (bad)

Visual Test : Ok/Failed/Unknown

Electrical Test : Ok/Failed/Unknown

field with yes or no : assembled, tested, accepted, destroyed

field with text: comment

parent : module id

side : 1 (for the P side) or 2 (for the N side) on the module

Module :
Wafer + Hybrids

As before

Wafer + Hybrids + Buses

Children : Id of the two buses

Characterization Test : Table containing the pedestal and noise values of each strip taken from Abdel's root file output of the offline software

Ladder :
Bare ladder

Ladder number : LAD_XX

Visual Test : Ok/Failed/Unknown

Visual Test Results : text comment ( none, ladder broken, etc...)

Geometrical Test : Ok/Failed/Unknown

Geometrical Test Results : Table containing the following values :

Weight : weight of the bare ladder in grams with the gram precision ( xxx g)

A : dimension in mm with 2 digit accuracy (xxxx,xx mm)

B1, B2, B3 : dimensions in mm with 2 digit accuracy (xx,xx mm)

C1, C2 : dimensions in mm with 2 digit accuracy (xxx,xx mm)

D1, D2 : dimensions in mm with 2 digit accuracy (xx,xx mm)

E : dimension in mm with 2 digit accuracy (xxx,xx mm)

Comment : text comment

Sagging Test A: Ok/Failed/Unknown

Sagging Test A Results : Table containing the following values :

Load(4) : 4 values of load in grams with the gram accuracy (xxx g)

Sag(4) : 4 values of the measured sag under the load in mm with 3 digit accuracy (xxx,xxx mm)

Slope : slope of the linear fit in mm/g with 4 digit accuracy (x,xxxx mm/g)

Intercept : intercept of the linear fit in mm with 3 digit accuracy (x,xxx mm)

Comment : text comment

field with yes or no : assembled, tested, accepted, destroyed

Quality : 0 (unknown), 1 (good), 2 (repaired) or 3 (bad)

Mechanically equipped ladder (bare ladder + junctions + stiffeners)

Sagging Test B : Ok/Failed/Unknown

Sagging Test B Results : Same table as the Sagging Test A Results

Sagging Test C : Ok/Failed/Unknown

Sagging Test C Results : Same table as the Sagging Test A Results

Electronically pre-equipped ladder (mechanically equipped ladder + ADC and C2D2 boards)

No specific fields or tests foreseen for the moment

Children : Id of the two ADC and the two C2D2 boards

Equipped ladder (electronically pre-equipped ladder + 16 modules)

Children : Id of the 16 modules

Working P : number of working P sides (from 0 to 16)

Working N : number of working N sides (from 0 to 16)

Working W : number of fully working modules (from 0 to 16)

Characterization Test : Table containing the pedestal, noise and average amplitude values measured with and without a source for each strip taken from Abdel's root file output of the offline software

Position A : Table containing the position of the silicon marks for the ladder oriented at 0 dgr splitted in two arrays : MS(16,3) and MF(16,3) in mm with 3 digit accuracy (xxx,xxx mm)

Position B : Same as Position A but for the ladder at 90 dgr (worst case)

Position C : Same as Position A but for the ladder at its final orientation

Position C Angle : Angle in dgr of the ladder for the C measurement with two digits accuracy ( xxx,xx dgr)

Wrapped ladder ( equipped ladder + Mylar sheet)

No specific fields or tests foreseen for the moment