List of Tables

1. Threshold momenta (GeV/c) of common charged particles for $C1$ and $C2$.
2. Functions of the Cherenkov detectors in the trigger for various momentum settings
3. Parameters of the multi-temperature fits to the transverse kinetic energy distributions of pions. See Section 4.1.2, Eq. 4.15. The fitting range is $0 < k_T <1.5 GeV$
4. The estimated fraction of events that do not create tracks in the spectrometer. It has been obtained according to the Poissonian law, $P(0) \simeq \exp(-2P(2)/P(1)$, based on the DST information.
5. RQMD-generated factors for acceptance matching. The following acceptance intervals were used. For the Si: ${\eta }_{min}=1.5$, ${\eta }_{max}=3.3$. For the spectrometer: in the low angle setting, ${\eta }_{min}=3.6$, ${\eta }_{max}=4.4$. In the high angle setting, ${\eta }_{min}=2.6$, ${\eta }_{max}=3.1$.
6. Radiation damage correction. The factors listed here are applied directly to $\,dN/\,dy$.
7. Trigger centrality $c$ of the physics settings.
8. Corrections for the PC in the trigger. "1" is used when PC was not part of the trigger. See section  4.3.3.
9. Summary of conditions used to identify a track as a $\pi$ (PID cuts). The ``$4\pi ^-$high'' setting was split in two because of different hodoscope calibrations. The $a$ and $b$ parameters are used to specify a slat-dependent hodoscope cut: $H3TOF < H3SLAT\times a + b$, where $H3TOF$ is time-of-flight, $H3SLAT$ is the slat number. Words ``see text'' refer to Subsection  4.4.4. The fields are left blank when a device was not used to apply a cut for the $\pi$ identification.
10. Multiplicative corrections to the $\pi$ yields related to the process of particle identification for the samples of top 10% and top 4% centrality.
11. Summary of conditions used to identify a track as a $K$ (PID cuts). The ``$8K^+$high'' setting was split in two because of different hodoscope calibrations. The $a$ and $b$ parameters are used to specify a slat-dependent hodoscope cut: $H3TOF < H3SLAT\times a + b$, where $H3TOF$ is time-of-flight, $H3SLAT$ is the slat number. The fields are left blank when a device was not used to apply a cut for the $\pi$ identification.
12. Corrections to the $K$ yields related to the process of particle identification for the samples of top 10% and top 4% centrality.
13. Summary of fractional systematic errors to the normalized yields. Positive kaons in the weak field high angle spectrometer setting are chosen as ``representative''. Maximum and minimum uncertainties indicate the range; the overall systematic uncertainty was evaluated for each setting separately.
14. Inverse slope parameters T.
15. Particle distributions in rapidity for top 4% centrality. Every spectrometer setting provides an independent measurement. Settings overlapping in $y$ are listed separately. Statistical and systematic errorbars are added in quadrature to form $\sigma(\,dN/\,dy)$ listed.
16. Data used in the Si analysis.
17. Sources of background texture (dynamic and static) and their treatment. The irreducible remainder estimate is quoted for diagonal texture correlation in the $326<\,dN/\,d\eta<398$ bin, and is expressed in the units of $\sigma^2/\langle dE_{MIP} \rangle^2$; see text for information on how it was obtained.