By static texture we mean texture which reproduces its pattern
event after event.
This can be either because it is coupled with detector channels (dead pads,
geometry distortion, channel cross-talk, etc) or because of static physics
features such as
shape.
We eliminate the static texture from the texture correlation
observable by empty target subtraction
(Subsection 6.7.2)
and by subtraction
of mixed events power spectra
(Subsection 6.6.2).
For comparison with models, a Monte Carlo simulation of the Si detector
is
used (Section 6.8).
It includes the known static texture
effects and undergoes the same procedure to remove the effects.
The ``irreducible remainder'' is the residual effect which may
The static texture group includes:
The background dynamic texture group includes:
Elliptic and directed flow, observed at SPS [10],
are large scale dynamic texture phenomena of primarily azimuthal
(elliptic) and diagonal (directed flow) modes.
Because both reaction plane and direction angle vary event by event,
the respective dynamic textures
can not be subtracted by event mixing, unless the events are
classified according to their reaction plane orientation and
the direction angle, with mixing and
subtraction done within those classes.
Neither reaction plane nor direction angle was reconstructed
in the present analysis, and the
(especially that of the azimuthal and diagonal modes on the coarse scale)
retain the elliptic/directed flow contribution.
The effects of flow on dynamic texture observables
are smaller than other texture effects,
so they can not be singled out and quantified in this analysis.
The finite beam cross-section effect belongs to this group,
despite the fact that a very similar effect of geometrical detecor/beam
offset has been classified as static texture.
An effect must survive mixing with its strength unaltered
in order to be fully subtracted via event mixing.
Preserving the effect of the random variations in the
vertex on the power spectra
in the mixed events requires classification of
events according to the vertex position
and mixing only within such classes.
This requires knowledge of the vertex for each event,
which is not available in this experiment.
Therefore, MC simulation of the beam profile remains the only way to quantify
false texture arising from vertex variations.
MC studies with event generators show that the
beam spatial extent and the resulting vertex variation is the source of
the growth
of the coarse scale azimuthal texture correlation with multiplicity
(see Fig. 7.1).
Uncertainty in our knowledge of the beam's geometrical cross-section
must be propagated into a systematic error on
.
Here is how it was done:
The other two effects in this group are difficult to separate
and simulate and the error
estimate reflects the combined effect.
The systematic errors were evaluated by removing the target and
switching magnetic field polarity to expose the given side of the detector
to
-electrons (from the air and T0),
while minimizing nuclear interactions.
This gives an ``analog'' generator of uncorrelated noise.
The runs used for this purpose are the positive field polarity runs
listed in Table 6.1.
All correlations (i.e. deviations of
from
)
in this noise generator are treated as systematic uncertainties.
Thus this component of the systematic error gets a sign,
and the systematic errors are asymmetric.
The effect of increasing texture correlation (for diagonal and azimuthal modes)
with multiplicity on the coarse scale, attributed to the geometrical
offset of the detector with respect to the beam
(the leading one in the static group), is present in the switched
polarity empty target runs as well.
For this reason, it was impossible to disentangle the background dynamic
contribution on the coarsest scale.
In Table 6.2, the ``irreducible remainder estimate'' for
the diagonal, coarse scale is bracketed with two numbers, which form the
lower and upper estimates.
The lower estimate is obtained by taking the scale one unit finer and quoting
its number.
This, indeed, sets the lower limit because the deviations of
from
generally grow with scale coarseness.
The upper limit is set by ascribing the entire texture correlation,
observed in the
-electron data, to the background hits and channel
cross-talk, and ignoring the fact that significant portion of it must be due
to the vertex fluctuation (finite beam profile).
This upper limit is likely to be a gross overestimation, and
in Fig. 7.1 we show systematic errors, obtained by
adding in quadrature the finite beam error with the background hit error.