By static texture we mean texture which reproduces its pattern event after event. This can be either because it is coupled with detector channels (dead pads, geometry distortion, channel cross-talk, etc) or because of static physics features such as shape. We eliminate the static texture from the texture correlation observable by empty target subtraction (Subsection 6.7.2) and by subtraction of mixed events power spectra (Subsection 6.6.2). For comparison with models, a Monte Carlo simulation of the Si detector is used (Section 6.8). It includes the known static texture effects and undergoes the same procedure to remove the effects. The ``irreducible remainder'' is the residual effect which may
The static texture group includes:
The background dynamic texture group includes:
Elliptic and directed flow, observed at SPS [10], are large scale dynamic texture phenomena of primarily azimuthal (elliptic) and diagonal (directed flow) modes. Because both reaction plane and direction angle vary event by event, the respective dynamic textures can not be subtracted by event mixing, unless the events are classified according to their reaction plane orientation and the direction angle, with mixing and subtraction done within those classes. Neither reaction plane nor direction angle was reconstructed in the present analysis, and the (especially that of the azimuthal and diagonal modes on the coarse scale) retain the elliptic/directed flow contribution. The effects of flow on dynamic texture observables are smaller than other texture effects, so they can not be singled out and quantified in this analysis.
The finite beam cross-section effect belongs to this group, despite the fact that a very similar effect of geometrical detecor/beam offset has been classified as static texture. An effect must survive mixing with its strength unaltered in order to be fully subtracted via event mixing. Preserving the effect of the random variations in the vertex on the power spectra in the mixed events requires classification of events according to the vertex position and mixing only within such classes. This requires knowledge of the vertex for each event, which is not available in this experiment. Therefore, MC simulation of the beam profile remains the only way to quantify false texture arising from vertex variations. MC studies with event generators show that the beam spatial extent and the resulting vertex variation is the source of the growth of the coarse scale azimuthal texture correlation with multiplicity (see Fig. 7.1). Uncertainty in our knowledge of the beam's geometrical cross-section must be propagated into a systematic error on . Here is how it was done:
The other two effects in this group are difficult to separate and simulate and the error estimate reflects the combined effect. The systematic errors were evaluated by removing the target and switching magnetic field polarity to expose the given side of the detector to -electrons (from the air and T0), while minimizing nuclear interactions. This gives an ``analog'' generator of uncorrelated noise. The runs used for this purpose are the positive field polarity runs listed in Table 6.1. All correlations (i.e. deviations of from ) in this noise generator are treated as systematic uncertainties. Thus this component of the systematic error gets a sign, and the systematic errors are asymmetric. The effect of increasing texture correlation (for diagonal and azimuthal modes) with multiplicity on the coarse scale, attributed to the geometrical offset of the detector with respect to the beam (the leading one in the static group), is present in the switched polarity empty target runs as well. For this reason, it was impossible to disentangle the background dynamic contribution on the coarsest scale. In Table 6.2, the ``irreducible remainder estimate'' for the diagonal, coarse scale is bracketed with two numbers, which form the lower and upper estimates. The lower estimate is obtained by taking the scale one unit finer and quoting its number. This, indeed, sets the lower limit because the deviations of from generally grow with scale coarseness. The upper limit is set by ascribing the entire texture correlation, observed in the -electron data, to the background hits and channel cross-talk, and ignoring the fact that significant portion of it must be due to the vertex fluctuation (finite beam profile). This upper limit is likely to be a gross overestimation, and in Fig. 7.1 we show systematic errors, obtained by adding in quadrature the finite beam error with the background hit error.